X-ray diffraction is one of the most important tools for materials characterization. It allows for the identification and quantification of crystalline phases, and can be used to determine specimen purity. XRD can also provide microstructural information such as crystallite size, microstrain and disorder. 

Our Bruker D8 is equipped with a Cu Kα x-ray source and is capable of wide range measurements from <1° to >150°. The system has a robotic 9-position sample changer, allowing for the submission of multiple samples at one time.  

The system is most commonly used for powder diffraction or bulk samples, however it can also be set up to perform grazing incidence (GIXRD) measurements for the analysis of thin films. 

There is also the option of using our Anton Parr HTK 1200 accessory, which allows heating of the sample environment up to a temperature of 1200°C. 

The London Centre for Energy Engineering

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