Ellipsometry is an optical technique for measuring the dielectric properties of materials (complex refractive index or dielectric function). It measures the change in polarisation of light as it is reflected or transmitted through a material structure. The measured response depends on the optical properties and thicknesses of individual materials and allows for characterisation of composition, roughness, layer thickness, crystalline nature, doping concentration, electrical conductivity and other material properties.  

Our spectroscopic ellipsometer from Angstrom Sun Technologies covers a broad range of wavelengths for multiple applications. 

The London Centre for Energy Engineering

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