Scanning electron microscopy uses a focused beam of high-energy electrons to produce detailed, high-magnification images of objects. This technique is widely used in materials science to identify properties such as particle size, particle morphology and film thickness.  

Our Zeiss SUPRA 55-VP microscope uses a field emission electron gun (FEG) which is the brightest type of electron source, giving high beam current and resolution capability. 

The SUPRA can be used to study a wide range of samples, from conducting and semiconducting materials, to large beam-sensitive or non-conducting samples. Non-conductive samples are with a thin layer of gold or carbon to prevent the build-up of charge on the sample surface during imaging. 

The microscope has a resolution of up to 1 nm and has a range of detectors including secondary electron, backscatter, and in-lens modes.  

The system is also equipped with an Oxford Instruments energy-dispersive X-ray (EDX) spectrometer, allowing for elemental analysis with a detection limit of roughly 0.5 at%. 

The London Centre for Energy Engineering

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